| 摘要 |
PURPOSE:To enable ease and accurate alignment by a method wherein a solid or liquid sample is vaporized to mix a carrier gas with a fixed concentration of component, and alignment is achieved between plasma torch and a sampling nozzle. CONSTITUTION:An argon gas is supplied to a high frequency induction plasma mass spectrograph 130 passing through a flow rate controller 110 and a gas generator 120. When by a command of a controller 140, the device 120 is heated to raise the inside of the device up to a high temperature, a solid sample 122 is vaporized corresponding to a vapor pressure at the temperature. As a result, the device 120 is filled with a gas containing a component with a density thereof corresponding to a temperature controlled with the controller 140b. The gas thus filled is carried to an analyzer 130 on a carrier gas. This enables alignment of a plasma torch even in an analysis method that only obtain a transient measurement signal as in a laser abrasion and ETV method. |
