发明名称 LITHOGRAPHY APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an apparatus and a method capable of effectively masking a part of a mask of a lithography projection apparatus during scanning and a static exposure. SOLUTION: A lithography apparatus comprises a masking device for covering at least a part of patterning means used for patterning a projected beam, before image formation of a patterned beam is performed on a substrate. The masking device comprises a first masking means for covering the part of the patterning means in a first direction and a second masking means for covering the part of the patterning means in a second different direction, and the first and second masking means are not mutually mechanically connected and arranged near the focal surface. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004363589(A) 申请公布日期 2004.12.24
申请号 JP20040158484 申请日期 2004.05.28
申请人 ASML NETHERLANDS BV 发明人 KUIPER DOEDE FRANS;JOHAN CORNELIS COMPTER;VAN EIJK JAN;MOLENAAR JACOBUS FREDERIK;DAVID CHRISTOPHER OCKWELL;JOHANNES WILHELMS MARIA CORNELIS TEEUVASEN;MARKUS PETRUS VAN DEURSEN;VAN DEN HOVEN GERBRAND PETRUS JOHANNES;VERVOORDELDONK MICHAEL JOHANNES;PARDOEL MICHEL GERARDUS;VERDOES GERARDUS JOHANNES;GERARD JOHANNES PIETER NIJSSE;GREVE PETER FERDINAND;JAN VAN VOORSCHUT;MARKUS MARTINES PETRUS ADRIANUS VERMEULEN;VERWEIJ ANTOINE HENDRIK
分类号 H01L21/027;G03F7/20;(IPC1-7):H01L21/027 主分类号 H01L21/027
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