| 摘要 |
PURPOSE:To decrease time required for the test for a plurality of operation device, by executing the operation of the test mode at the same time at all the operation device connected to a common controller, through the provision of a circuit which simultaneously selects the operation devices in the common controller. CONSTITUTION:A common controller 2 is connected to a CPU1 with a bus cable and operation devices 3 and 4 are connected to the device 2 with interface lines 106-109. The device 2 is provided with a priority selection section 22 controlled with a common control section 21, an operation device determining section 23 and an operation device control section 24, the test mode is set to the section 23 from the control section 21 via an interface line 113 and the output of the selection section 22 accesses the operation devices 3 and 4 set to the test mode at the same time. The operation of the test mode is executed at the operation devices 3 and 4 at the same time and the result is returned to the CPU1 via the control section 24, allowing to decrease the time required for the test of the operation devices 3 and 4 of a plurality of sets. |
