发明名称 SIMULTANEOUS DOUBLE INSPECTION
摘要 The invention relates to a method for inspecting an object or a series of successively supplied objects for deviations such as form errors, dirt, cracks and so on, comprising the following steps of: 1) providing at least one illuminating station for emitting electromagnetic radiation of a chosen type, 2) providing at least one associated sensing station which is arranged for sensing the electromagnetic radiation emitted by the illuminating station, 3) providing an object for inspection, and 4) arranging in alignment the or each illuminating station, the or each associated sensing station and the object, such that the or each sensing station can form an image of the object illuminated by the associated illuminating station. 5) providing only one illuminating station and/or only one sensing station, which illuminating station transmits electromagnetic radiation of at least two types and which sensing station can sense electromagnetic radiation of these at least two types, wherein the image formed from the radiation of the one type can give information about deviations of the first type and the image formed from radiation of the second type can give information about deviations of the second type etc., such that two or more types of deviation can be determined simultaneously. o
申请公布号 AU4973590(A) 申请公布日期 1990.08.23
申请号 AU19900049735 申请日期 1990.02.13
申请人 HEUFT-QUALIPLUS B.V. 发明人 LUCIEN JOHANNES NELEN
分类号 G01N21/88;G01N21/90 主分类号 G01N21/88
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