发明名称 INSPECTING A PATTERN
摘要 In a method for inspecting a pattern produced by using pattern data of a predetermined reference pattern, comparison is carried out between the pattern reproduced from the scanning signal of the pattern and the pattern produced from the signal of a modified form of the predetermined reference pattern.
申请公布号 IE822013(L) 申请公布日期 1983.02.20
申请号 IE19820002013 申请日期 1982.08.20
申请人 FUJITSU LTD 发明人
分类号 G01N21/88;G01N21/956;G03F1/84;G03F7/20;G06T7/00 主分类号 G01N21/88
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