| 摘要 |
PURPOSE:To extremely shorten the test time of an LSI circuit by using an output transistor (TR) connected to a terminal in a 1-chip semiconductor substrate and a multiplexer which selects a control signal or a test control signal at real working of the output TR and decides the input of the output TR. CONSTITUTION:The semiconductor device is provided with an output TR part 1 connected to a terminal in a 1-chip semiconductor substrate, a multiplexer part 2 which selects a control signal or a test control signal at real working of the part 1 and decides the input of the part 1. In such a constitution, the outputs of all output terminals contained in the semiconductor substrate can be designated at one time in a test mode. As a result, the setting time is shortened for designation of output and furthermore the output designating way is simplified. Then the test time is extremely shortened and the test efficiency is improved. |
