Semiconductor integrated circuit having a built-in voltage generator for testing at different power supply voltages

摘要

An integrated circuit provided with a test scheme for allowing a control of the voltage applied to internal circuit elements is disclosed and includes a functional circuit, an internal voltage generator generating an internal operating voltage for the functional circuit from an externally applied power voltage, a switch for selectively applying the externally applied power voltage to the functional circuit, and a control circuit for controlling the switch.