发明名称 TROUBLE DETECTING SYSTEM
摘要 PURPOSE:To easily detect not only trouble with a multichip package MCP as the unit but also a faulty chip in the MCP without requiring large-scale hardware by adding a discrimination code to scan path data. CONSTITUTION:A multichip package which consists of plural chips 21 to 2C internally provided with flip flops in the last stage and connecting means and has plural chips 21 to 2C cascaded by scan paths 3 is provided to constitute a trouble detecting system. The discrimination code indicating the value prescribed as a reset time is stored in the flip flop in the last stage. If trouble occurs in LSI chips 21 to 2C or flip flops in chips at the time of impressing a scan clock, normal data is not propagated on scan paths, and a multibit register is added to the last stage of each LSI chip to locate the trouble position.
申请公布号 JPH02210550(A) 申请公布日期 1990.08.21
申请号 JP19890031551 申请日期 1989.02.10
申请人 NEC CORP;SHIKOKU NIPPON DENKI SOFTWARE KK 发明人 NAGASAKI YOSHIHIRO;YANO TAKATOSHI
分类号 G06F11/22 主分类号 G06F11/22
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