ELECTRICAL CIRCUIT TEST PROBE AND CONNECTOR

摘要

An improvement to electrical circuit test probes of the type wherein a socket tube having a cylindrical spring loaded plunger therein is mounted in a test fixture. Electrical contact is assured between the socket and the plunger as the plunger moves longitudinally by the plunger having a resiliently flexible wand extending inwardly therefrom at an angular offset to the longitudinal axis of the plunger and the wand terminating in a bulbous contact member. The contact member is disposed within a cylindrical plunger tube and passes through an opening through which the contact member cannot pass. As a result, the wand acts as a flexible resilient finger holding the contact member firmly against the inner wall of the plunger tube as the plunger is moved in and out through its limits of movement.