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发明名称
TEST CIRCUIT FOR SEMICONDUCTOR INTEGRATED CIRCUIT
摘要
申请公布号
JPH02206773(A)
申请公布日期
1990.08.16
申请号
JP19890027276
申请日期
1989.02.06
申请人
MITSUBISHI ELECTRIC CORP
发明人
AOKI KAZUO
分类号
G01R31/28;H01L21/822;H01L27/04
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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