首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
TESTING DEVICE FOR INTEGRATED CIRCUIT
摘要
申请公布号
JPH02203287(A)
申请公布日期
1990.08.13
申请号
JP19890023393
申请日期
1989.01.31
申请人
SHARP CORP
发明人
SHIBATA HIROYUKI
分类号
G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
您可能感兴趣的专利
SEMICONDUCTOR DEVICE CONTACT LAYERS
PHOTOTROPIC UNITS
ABRASIVE LIQUID DETERGENT COMPOSITIONS
TESTING OF DECODERS FOR F.M. RECEIVERS AND TEST SIGNAL GENERATORS FOR USE IN SUCH TESTING
OPTICAL INFORMATION DISPLAY SYSTEM
TERMINATION OF VACUUM-INSULATED HIGH-VOLTAGE CONDUCTOR
ELONGATED SECTIONALIZING SWITCH
HIGH CURRENT ROTARY SWITCH FOR CONNECTING ONE OF A FIRST SET OF TERMINALS TO A SELECTED ONE OF A SECOND SET OF TERMINALS
PHOSPHOROUS COMPOUNDS
METHOD OF ELECTRODEPOSITING A TINBISMUTH ALLOY AND COMPOSITIONS THEREFOR
VENEERED PRODUCT AND A CROSSBANDING MATERIAL THEREFOR
COPPER BASE ALLOY
ECCENTRICALLY ROTATED ROD HOLDER FOR CRUCIBLE-FREE ZONE MELTING
DEVICE FOR TESTING A SAMPLE WITH SOLAR RADIATION INCLUDING MEANS TO DAMPEN THE SAMPLE
INSTRUMENT LENS SUPPORT
METHOD OF PHOSPHOR SURFACE COATING
FLARELESS CONNECTION AND SEALING ELEMENT FOR SUCH A CONNECTION
Prodn of calcium carbonate fillers
HYDROLYSIS OF RIBONUCLEIC ACID-CONTAINING MATERIALS
DEMOUNTABLE RUNNING GEAR WITH AIR BAG AND TORSION ARM SUSPENSION