发明名称 Substrate used for fabrication of thick film circuit.
摘要 An insulating substrate is used for fabrication of a thick film circuit and comprises a foundation (1) of aluminum nitride and a surface film structure (2) provided on the foundation, in which the foundation contains at least one oxidizing agent selected from the group consisting of an yttrium oxide and a calcium oxide ranging from 0.1 % to 10 % by weight for enhancing a stiffness of the foundation, and in which the surface film structure is of the multi-level surface film structure having a lower surface film (3) of an aluminum oxide rapidly grown on the foundation in the presence of the oxidizing agent and an upper surface film (4) containing a silicon oxide and a substance selected from the group consisting of a zirconium oxide, a titanium oxide and a boron oxide for enhancing the resistivity against a firing operation.
申请公布号 EP0381242(A1) 申请公布日期 1990.08.08
申请号 EP19900102122 申请日期 1990.02.02
申请人 MITSUBISHI METAL CORPORATION 发明人 KUROMITSU, YOSHIROU C/O MITSUBISHI METAL CORP.;YOSHIDA, HIDEAKI C/O MITSUBISHI METAL CORP.;NAGASE, TOSHIYUKI C/O MITSUBISHI METAL CORP.;UCHIDA, HIROTO C/O MITSUBISHI METAL CORP.;TANAKA, TADAHARU C/O MITSUBISHI METAL CORP.;KANDA, YOSHIO C/O MITSUBISHI METAL CORP.;MORINAGA, KENJI
分类号 H01L23/15;H01L23/31 主分类号 H01L23/15
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