| 摘要 |
A capacitance sensor for measuring thickness variations in film materials, having a sensor mounted in a housing plate slot, with an air gap between the sensor and the housing plate, the sensor being affixed to an insulator support plate, the insulator support plate being affixed to the housing plate, with a bottom plate affixed against the lower side of the housing plate, having enlarged openings for permitting the passage of a conductor to the sensor; all of the conductor and insulator materials having a coefficient of linear temperature expansion of less than 1x10-6 per degree centrigrade, the insulator materials having virtually no dialectic variation with temperature.
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