| 摘要 |
PURPOSE:To make it possible to carry out the reading process of an electron microscopic image in a short time by determining the proper reading condition basing on the exposed amount of electron beam at the recording time of the electron microscopic image, storing this reading condition in a storage means, and reading out and setting the stored reading condition at the reading time of the electron microscopic image. CONSTITUTION:From a magazine 15 set in an electron microscopic image reading unit 80, storage phosphor sheets 11 are taken out one by one and placed on a conveying means 70 consisting of such as an endless belt. And the storage sheet 11 is irradiated with exciting light beam 72 all over the sheet. Under the irradiation of the exciting light the storage sheet 11 emits accelerated luminescence 74 of a level corresponding to the electron beam energy stored in the sheet. The accelerated luminescence 74 incident to the entrance plane 75a of a light collector 75 is emitted from the output plane 75b after repeating total reflection in the collector 75, and sent to a light detector 76 connected to the output plane 75b, then the light quantity of the accelerated luminescence 74 is read photoelectrically and set in a condition reading device 55. Therefore in an electron microscopic image reading device 10 the reading condition of the last storage phosphor sheet 11 dropped in the magazine is read out at first.
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