| 摘要 |
PURPOSE:To control the upper/simultaneous/lower end of data transfer and to reduce the manhour of a test by reading out a testing data count stored correspondingly to a testing command to control the volume of data transfer. CONSTITUTION:At the time of receiving a start signal, a test mode control circuit 58 commands a testing command reading control circuit 57 to read out a testing command from a main storage device 2 based upon the leading address of a testing command group and applies the command to an I/O processor 3 as an interruption signal through a selector 59, a receiving register 55 and a receiving buffer 54. After transferring a prescribed data, the circuit 57 is commanded to send an end status request command and to send an end status and an end command to an I/O processor 3 through a selector 59 or the like to end a series of transfer operation. |
