METHOD FOR TESTING INSTANTANEOUS DISCONNECTION OF POWER SUPPLY IN SEMICONDUCTOR INTEGRATED CIRCUIT,申请号JP19890013974-传众专利搜索

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发明名称	METHOD FOR TESTING INSTANTANEOUS DISCONNECTION OF POWER SUPPLY IN SEMICONDUCTOR INTEGRATED CIRCUIT
摘要
申请公布号	JPH02195447(A)	申请公布日期	1990.08.02
申请号	JP19890013974	申请日期	1989.01.25
申请人	HITACHI LTD;HITACHI MICRO COMPUT ENG LTD	发明人	OKUZAKI KOJI;TANAKA NORIYUKI
分类号	G06F11/24	主分类号	G06F11/24
代理机构		代理人
主权项
地址

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