| 摘要 |
A grazing incidence reflection spectrometer having a light source projecting light to a surface of a sample (1), and having means to detect the intensity of light (3) reflected from the sample surface, is cahracterized in that the incident light (2) is linearly polarized light (6) whose plane of polarization is perpendicular to a plane (5) contg. (2) and (3), that the light source has a variable wavelength of 200-700 nm, that the glancing angle (theta) with respect to the surface of (1) is such that the reflectivity from the sample of (2) comes close to one, and that the spectrometer is intended to measure the electronic absorption spectrum of a material absorbed to the sample surface.
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