发明名称 |
METHOD OF FABRICATING NITRIDE FILM |
摘要 |
The present invention relates to a method for fabricating a nitride film, which can easily control compressive stress while stably maintaining a film quality by using an atomic layer deposition method. The method for fabricating a nitride film forms a nitride film with compressive stress on a substrate by performing, at least once, a unit cycle comprising: a first step of supplying source gas to a substrate to adsorb at least a portion of the source gas onto the substrate; a second step of supplying first purge gas to the substrate; a third step of supplying stress control gas containing nitrogen gas (N_2) and reaction gas containing a nitrogen (N) component other than the nitrogen gas (N_2) to the substrate in a plasma state to form a unit deposition film on the substrate; a fourth step of supplying second purge gas to the substrate; and a step of stopping the supply of the source gas and maintaining the pressure inside a chamber lower than that in the first step, after the first step and before the second step. |
申请公布号 |
KR20160085567(A) |
申请公布日期 |
2016.07.18 |
申请号 |
KR20150002730 |
申请日期 |
2015.01.08 |
申请人 |
WONIK IPS CO., LTD. |
发明人 |
LEE, KYUNG EUN;CHANG, JUN SEOK;CHO, BYUNG CHUL;RYU, DONG HO;KIM, YOUNG JUN |
分类号 |
H01L21/318;H01L21/314 |
主分类号 |
H01L21/318 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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