发明名称 METHOD OF FABRICATING NITRIDE FILM
摘要 The present invention relates to a method for fabricating a nitride film, which can easily control compressive stress while stably maintaining a film quality by using an atomic layer deposition method. The method for fabricating a nitride film forms a nitride film with compressive stress on a substrate by performing, at least once, a unit cycle comprising: a first step of supplying source gas to a substrate to adsorb at least a portion of the source gas onto the substrate; a second step of supplying first purge gas to the substrate; a third step of supplying stress control gas containing nitrogen gas (N_2) and reaction gas containing a nitrogen (N) component other than the nitrogen gas (N_2) to the substrate in a plasma state to form a unit deposition film on the substrate; a fourth step of supplying second purge gas to the substrate; and a step of stopping the supply of the source gas and maintaining the pressure inside a chamber lower than that in the first step, after the first step and before the second step.
申请公布号 KR20160085567(A) 申请公布日期 2016.07.18
申请号 KR20150002730 申请日期 2015.01.08
申请人 WONIK IPS CO., LTD. 发明人 LEE, KYUNG EUN;CHANG, JUN SEOK;CHO, BYUNG CHUL;RYU, DONG HO;KIM, YOUNG JUN
分类号 H01L21/318;H01L21/314 主分类号 H01L21/318
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