| 摘要 |
For spatial high resolution imaging of a structure of a sample comprising a luminophore, the sample is subjected to excitation inhibiting light transferring the luminophore out of an excitable electronic ground state into a protection state in which the luminophore is protected against electronic excitation by luminescence excitation light and luminescence de-excitation light. The excitation inhibiting light comprises a first local minimum. Next, the sample is subjected to the luminescence excitation light exciting the luminophore within the first local minimum into an excited luminescent state. Then, the sample is subjected to the luminescence de-excitation light returning the luminophore out of the excited luminescent state into the excitable electronic ground state. The luminescence de-excitation light comprises a second local minimum overlapping with the first local minimum. Luminescence light emitted out of the measurement area is measured and assigned to the position of the second local minimum within the sample. |
