发明名称 |
Arrayed imaging systems having improved alignment and associated methods |
摘要 |
Arrayed imaging systems include an array of detectors formed with a common base and a first array of layered optical elements, each one of the layered optical elements being optically connected with a detector in the array of detectors. |
申请公布号 |
US9418193(B2) |
申请公布日期 |
2016.08.16 |
申请号 |
US201314093802 |
申请日期 |
2013.12.02 |
申请人 |
OmniVision Technologies, Inc. |
发明人 |
Dowski, Jr. Edward R.;Silvieri Paulo E. X.;Barnes, IV George C.;Chumachenko Vladislav V.;Dobbs Dennis W.;Fan Regis S.;Johnson Gregory E.;Scepanovic Miodrag;Tachihara Satoru;Linnen Christopher J.;Tamayo Inga;Combs Donald;Rhodes Howard E.;He James;Mader John J.;Kubala Kenneth;Meloni Mark;Schwartz Brian;Cormack Robert;Hepp Michael;Duerksen Gary L. |
分类号 |
G02B13/16;H04N5/225;G06F17/50;B24B13/06;B24B49/00;G02B3/00;G02B7/02;G02B13/00;G02B27/00;H01L27/146 |
主分类号 |
G02B13/16 |
代理机构 |
Lathrop & Gage LLP |
代理人 |
Lathrop & Gage LLP |
主权项 |
1. A method for manufacturing arrayed imaging systems, each imaging system in the arrayed imaging systems having a detector associated therewith, the method comprising:
fabricating an array of layered optical elements by sequentially applying a fabrication master, each layered optical element being part of a respective imaging system of the arrayed imaging systems and optically connected with the detector associated with that imaging system; wherein sequentially applying the fabrication master includes aligning the fabrication master to a common base, with alignment error not exceeding than two wavelengths of electromagnetic energy detectable by the detector. |
地址 |
Santa Clara CA US |