发明名称 TEST CIRCUIT FOR MICROCOMPUTER
摘要 PURPOSE:To simplify a program and to increase program executing speed by storing the data and the control signals into a shift register without using a data bus, an accumulator, etc., and then outputting these data and signals directly and serially via a serial output terminal when the working function of an arithmetic logic unit ALU is tested. CONSTITUTION:When the working function of an ALU 1 is tested, the digital data DATA Y and X and the ALU control signals are directly stored in the 1st-3rd shift register 2-4 via a serial application terminal 11 without using a data bus and an accumulator. At the same time, the computing results stored in both registers 6 and 7 are directly and serially outputted via a serial output terminal 20 without using a data bus and an accumulator. Thus it is not required to use a program instruction for the production of the ALU control signal. As a result, the number of program steps is decreased and a program is simplified. Then the program executing speed is increased.
申请公布号 JPH02188837(A) 申请公布日期 1990.07.24
申请号 JP19890008371 申请日期 1989.01.17
申请人 SANYO ELECTRIC CO LTD 发明人 KON YOSHIHIKO
分类号 G06F11/22;G06F15/78 主分类号 G06F11/22
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