发明名称 Operation microscope
摘要 An operation microscope includes: an ordinary light path that guides light from an observation target to an eyepiece; a first secondary light path branched off from the ordinary light path; a second secondary light path merging with the ordinary light path; an imaging unit that images the observation target using light from the first secondary path; a display unit that displays an image based on an image signal from the imaging unit toward the second secondary path; and a reflector provided at a branch point of the ordinary light path and the first secondary light path in such a manner as to be capable of pulling off the branch point, and that bends the ordinary light path by reflection. The first secondary light path extends from the branch point along an extension of the ordinary light path before being reflected.
申请公布号 US9442280(B2) 申请公布日期 2016.09.13
申请号 US201113881182 申请日期 2011.10.28
申请人 MITAKA KOHKI CO., LTD. 发明人 Yamazaki Toshio
分类号 G02B21/22;G02B21/00;A61B1/04;A61B5/00 主分类号 G02B21/22
代理机构 Greenblum & Bernstein, P.L.C. 代理人 Greenblum & Bernstein, P.L.C.
主权项 1. An operation microscope comprising: an ordinary light path configured to guide light from an observation target to an eyepiece; a first secondary light path branched off from the ordinary light path; a second secondary light path merging with the ordinary light path; an imaging unit configured to image the observation target using light from the first secondary path; a display unit configured to display an image based on an image signal from the imaging unit toward the second secondary path; and a reflector provided at a branch point of the ordinary light path and the first secondary light path in such a manner as to be capable of pulling off the branch point, and configured to bend the ordinary light path by reflection, wherein the first secondary light path extends from the branch point along an extension of the ordinary light path before being reflected, the second secondary light path is connected to the ordinary light path at a connection point located between the branch point and the eyepiece, and the operation microscope further comprises a reflective plate configured to be inserted into the connection point when the reflector pulls out, and to reflect light from the second secondary light path to the ordinary light path.
地址 Tokyo JP