| 摘要 |
<p>PURPOSE:To enable sufficient functional test and high reliability at low cost by arranging cells for the first test in the column selector side of each column line, and cells for the second test in a row decoder of each row alternately one at the nearest position and the fastest position, and placing at least one in each column line. CONSTITUTION:In the case where test is started and a test row decoder 12 is selected, a main row decoder 3 becomes non-selection and test on writing and reading to cells 11 for first test connected to each column line is performed by a column selector 5. When selecting a column selector 14 for test, a main column selector 5 becomes non-selection, and test on writing and reading to cells 13 for second test connected to each row is performed by a row decoder 3. Cells 11 for first test connected to each column line by a row decoder 12 for test are arranged at nearest position and farthest position from the main column selector 5 alternately in each column line. Accordingly, a delay test of speed due to stray capacity, resistance etc. of column line can also be executed, and a function test of memory cell and AC characteristic is also able to be executed.</p> |
