发明名称 MEMORY MEDIUM MEASURING SYSTEM
摘要 PURPOSE:To enable adaptation to a variety of measurements by employing an arrangement wherein a command for controlling a measuring device which test and measures a characteristic of a memory medium is possessed being filed as command data train within an external memory to read in the command from a file. CONSTITUTION:(n) command data trains are stored in a file for storing command data trains and each contain a command string 11, a command discrimination element 12 and a comment 13. An external memory means 1 generates a file 10 to store a command data train 14 for the control of a measuring device 5 to be stored into an external memory. The command discriminating means 31 retrieves a command discrimination element incorporated into the command data train read in to extract a command string only. The measuring device 5 receiving a command is controlled by the command to test and measure a characteristic of a memory medium 6 connected to the measuring device 5.
申请公布号 JPH02186283(A) 申请公布日期 1990.07.20
申请号 JP19890006171 申请日期 1989.01.12
申请人 NEC CORP 发明人 SHIRAI YUKI
分类号 G01R31/28;G06F11/22 主分类号 G01R31/28
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