| 摘要 |
An apparatus for measuring leaks associated with a sealed lamp assembly, includes an RF source for establishing an ionizing discharge in association with the lamp assembly, a source of continuous-wave probe radiation for irradiating the established ionizing discharge, and a pickup coil and associated circuitry for monitoring current flow through the ionizing discharge in response to the probe irradiation of the ionizing discharge. A signal is provided representing changes in the ionizing discharge resulting from the probe irradiation. A partially reflecting mirror partially deflects a portion of the probe radiation before it reaches the ionizing discharge. A signal is provided representing the deflected probe radiation. A computer receives the signals representing the changes in the ionizing discharge and the signals representing the deflected probe radiation, whereby the computer provides data representing pressure changes in the sealed lamp assembly. The pressure changes are normalized with respect to changes in the source of probe radiation.
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