发明名称 High voltage MOS structure
摘要 The threshold of a double diffused insulated gate field effect transistor is determined by selectively positioning the source in the decreasing impurity concentration region of the body to set the peak impurity concentration in the channel region for the desired threshold voltage without modification of the process.
申请公布号 US4941027(A) 申请公布日期 1990.07.10
申请号 US19890302386 申请日期 1989.02.27
申请人 HARRIS CORPORATION 发明人 BEASOM, JAMES D.
分类号 H01L29/10;H01L29/78 主分类号 H01L29/10
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