发明名称 |
SPIN POLARIZATION SCAN TUNNELING MICROSCOPE |
摘要 |
PURPOSE: To detect surface magnetic development with a resolution close to an atom level by providing a tunnel tip arranged so that it faces the surface of a sample to be inspected with a gap of 0.1-10nm. CONSTITUTION: A tip 10 is made of an optically transparent material such as glass and is covered with a thin layer 11 of gallium arsenide. The tip 10 is placed near the surface of a magnetic medium 12 such as a magnetic thin film 13 that covers a basement 14. In this case, three operation modes exist, and a light energy hv is supplied from a reverse side through the tip 10 (1), from a side surface at an angle of 6 (2), and from an area below a magnetic thin film 13 (3). The domain structure of a magnetic surface can be inspected with an extremely high resolution by any one of the three modes. |
申请公布号 |
JPH02176482(A) |
申请公布日期 |
1990.07.09 |
申请号 |
JP19890192794 |
申请日期 |
1989.07.27 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
SANTOSU FURANSHISUKO ARUBARAADO GUTEIERESU;AREKUSHISU BARATOFU;BUORUFUGANGU DEIITERU POORU |
分类号 |
G01R33/032;G01N27/00;G01N27/72;G01N37/00;G01Q30/02;G01Q60/16;G01Q60/56;G01Q70/14;G01R33/10;H01J37/26;H01J37/28 |
主分类号 |
G01R33/032 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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