| 摘要 |
An arrangement for testing printed-circuit boards, in the case of a known arrangement, the adaptor device contains two sets of printed-circuit boards arranged side-by-side, which each have contacts on their narrow input-side in an interval, which corresponds to half of the standard contact spacing. Circuit-board conductors connect these contacts to contact elements on a narrow output-side, opposite the narrow input-side. These contact elements lie in standard contact spacing. By placing the two sets of printed circuit-boards, one over another in a cross-wise arrangement, a printed-circuit board to be tested with a small contact spacing can be connected to contact surfaces in a basic grid. Supporting the adaptor device, when contact is made with the test place, is made more difficult, as a result of the contact elements located on the bottom side. In the arrangement, the contact elements in the area of at least one narrow output-side of each printed-circuit board bordering on the narrow input-side are arranged one behind the other in the direction of the narrow output-side. Contact pieces of an electric connection panel are situated in bore holes introduced from one narrow output-side and extending up to the contact elements. In the arrangement, the adaptor device can easily be adequately supported on the side opposite the printed-circuit board to be tested.
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