发明名称 Method of and device for inspecting and/or controlling metallization processes
摘要 A method for checking and/or controlling a metallization process in a galvanizing or chemical is based on the measurement of light scattered off or reflected from a surface portion being metallized. A deviation from a predetermined nominal value of the scattered or reflected light intensity serves for controlling at least one process parameter to neutralize the deviation.
申请公布号 US4939370(A) 申请公布日期 1990.07.03
申请号 US19880266382 申请日期 1988.11.02
申请人 SCHERING AKTIENGESELLSCHAFT 发明人 MEYER, HEINRICH;PLIETH, WALDFRIED J. L.;KURPJOWEIT, MARTIN
分类号 C23C16/52;C23C18/16;C23C18/31;C23C18/34;C23C18/40;C23C18/44;C25D21/12;G01B11/06 主分类号 C23C16/52
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