发明名称 |
Method of and device for inspecting and/or controlling metallization processes |
摘要 |
A method for checking and/or controlling a metallization process in a galvanizing or chemical is based on the measurement of light scattered off or reflected from a surface portion being metallized. A deviation from a predetermined nominal value of the scattered or reflected light intensity serves for controlling at least one process parameter to neutralize the deviation.
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申请公布号 |
US4939370(A) |
申请公布日期 |
1990.07.03 |
申请号 |
US19880266382 |
申请日期 |
1988.11.02 |
申请人 |
SCHERING AKTIENGESELLSCHAFT |
发明人 |
MEYER, HEINRICH;PLIETH, WALDFRIED J. L.;KURPJOWEIT, MARTIN |
分类号 |
C23C16/52;C23C18/16;C23C18/31;C23C18/34;C23C18/40;C23C18/44;C25D21/12;G01B11/06 |
主分类号 |
C23C16/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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