发明名称 RADIATION SENSITIVE COMPOSITION AND PATTERN FORMING METHOD USING THIS COMPOSITION
摘要 PURPOSE:To enhance the sensitivity and resolution to active radiations of the compsn. and to shorten the time for baking after exposing by using a prescribed compd. which generates an acid by irradiation of radiations and a prescribed phenolic resin. CONSTITUTION:This compsn. consists of the compd. (A) which generates an acid by irradiation of the radiations and the alkali soluble phenolic resin (B) contg. a methoxymethyl group or/and methylol group. After the above-mentioned compsn. is applied on the substrate and is prebaked, patterns are transferred thereto by irradiation of the radiations. The compsn. is then developed with an alkaline developing soln. to obtain the negative type patterns. An onium salt, such as diaryl iodonium salt is usable for the component A and an alkaline soluble high-polymer compd. contg. the unit expressed by the formula is preferably used for the component B. In the formula R denotes H, methyl; n, m denotes 1, 2.
申请公布号 JPH02170165(A) 申请公布日期 1990.06.29
申请号 JP19880323616 申请日期 1988.12.23
申请人 HITACHI LTD;HITACHI CHEM CO LTD 发明人 HASHIMOTO MICHIAKI;TADANO KEIKO;CHOKAI MINORU;IWAYAGI TAKAO;SHIRAISHI HIROSHI;HAYASHI NOBUAKI
分类号 G03F7/004;H01B5/14;H01L21/027 主分类号 G03F7/004
代理机构 代理人
主权项
地址