发明名称 ELECTRICAL TESTING PROBE
摘要 <p>For contacting electrical pads of different geometries, an electrical testing probe (7) comprises: a probe body (11) which is generally laminar and which tapers downwardly to provide a contact portion (17); and a carrying member (8) which carries said probe body.</p>
申请公布号 WO1990007125(A1) 申请公布日期 1990.06.28
申请号 GB1989001473 申请日期 1989.12.11
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