发明名称 Method of making conductive paths through a lamina in a semiconductor device
摘要 On the layer 12 a mask 3 corresponding to the desired pattern of holes 15 is provided with via openings 14 having overhanging walls. The layer 12 is selectively etched with a method where the etching attack takes place vertically to the layer surface, and wherein the mask 3 is thinned simultaneously, so that holes 15 are obtained having a cross-section increasing toward the mask 3. If subsequently material 16 for filling the holes 15 is applied in a blanket deposition these holes are completely filled when the material 16 has the same thickness as the layer 12 although the openings over the holes are decreasing with increasing thickness of the material 16. The layer 12 consists preferably of an insulation material, the mask 3 of positive photoresist, and the material 16 of a metal.
申请公布号 US4378383(A) 申请公布日期 1983.03.29
申请号 US19810312198 申请日期 1981.10.19
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 MORITZ, HOLGER
分类号 H01L21/3205;H01L21/027;H01L21/033;H01L21/28;H01L21/302;H01L21/306;H01L21/3065;H01L21/768;H05K3/14;H05K3/40;H05K3/46;(IPC1-7):H01L21/28 主分类号 H01L21/3205
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