发明名称 Method of forming a configuration of interconnections on a semiconductor device having a high integration density
摘要 A method of the kind consisting in that a contact is obtained with an active zone (11) carried by a semiconductor substrate (10) by means of conductive contact studs (18a) located in the contact openings (16c) of an isolating layer (12) and in that then a metallic configuration of interconnections (22) is formed establishing the conductive connection with the conductive contact studs (18a). A separation layer (13) is provided between the isolating layer (12) and the conductive layer (18), which can be eliminated selectively with respect to the isolating layer (12). Thus, the isolating layer (12) retains its original flatness and the conductive contact studs (18a) have an upper level (20) exceeding slightly the level (21) of the isolating layer (12), thus favoring the contact between these contact studs (18a) and the metallic configuration of interconnections (22). Application in microcircuits having a high integration density.
申请公布号 US4936950(A) 申请公布日期 1990.06.26
申请号 US19890339029 申请日期 1989.04.14
申请人 U.S. PHILIPS CORPORATION 发明人 DOAN, TRUNG T.;DE BRUIN, LEENDERT;GRIEF, MALCOLM K.;GODON, HARALD
分类号 H01L21/3205;H01L21/768;H01L23/52 主分类号 H01L21/3205
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