发明名称 DEYUARUGEETODENKAIKOKAGATATORANJISUTA
摘要 PURPOSE:To suppress the mutual action between electrodes by forming the same conductive layer region as a channel layer, and providing the first and second gate metal electrodes to expand a distance between gates on the conductive region. CONSTITUTION:Electrode patterns are formed with a curvature so that the shortest distance of an insulating film between electrodes may become as long as allowable in the performance of an element. Particularly, an n type channel layer 12 is extended out of an active region to form an n type conductive layer region 17, gate electrodes 18, 19 are bent in a curvature on the region 17 to form to extend the distance between the gates. Accordingly, an electric field concentration is prevented. The curvature and the extension of the interval between the gate electrodes 18 and 19 are so set as to increase the shortest distance between the gates on the insulating film in the degree that the mutual action between the first gate electrode 18 and the second gate electrode 19 does not affect the influence to the performance of an FET.
申请公布号 JPH0227823(B2) 申请公布日期 1990.06.20
申请号 JP19840183308 申请日期 1984.08.31
申请人 SHARP KK 发明人 INOE TADAAKI;TOMITA KOJI;YOSHIKAWA MITSUNORI;TAKAGI JUNKO
分类号 H01L29/80;H01L29/812 主分类号 H01L29/80
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