发明名称 Near infrared polyethylene inspection system and method.
摘要 <p>A sample inspection arrangement incorporates a sample of natural polyethylene with an included defect, or flaw, a light source containing near infrared wavelengths, and a video camera. Natural polyethylene has relatively high spectral transmissivity for wavelengths in the band of near infrared wavelengths. The video camera collects data from a beam of the near infrared light which either reflects from or is transmitted directly through a portion of the natural polyethylene sample. Data is collected from both defect free portions of the polyethylene sample and portions of polyethylene sample including at least one defect. A visual image of the polyethylene sample and included defect is produced on either a video monitor, a paper print out, or a photograph. The method for inspecting a sample of cable or a continuously moving section of cable also is described.</p>
申请公布号 EP0373796(A2) 申请公布日期 1990.06.20
申请号 EP19890312503 申请日期 1989.11.30
申请人 AMERICAN TELEPHONE AND TELEGRAPH COMPANY 发明人 ORTIZ, MARCOS GERMAN;STIX, MARSHA SPALDING
分类号 G01N21/88;G01N21/89;G01N21/892;G01N21/95;G01N21/952;H01B3/44;H01B9/02;H04N7/18 主分类号 G01N21/88
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