发明名称 |
Near infrared polyethylene inspection system and method. |
摘要 |
<p>A sample inspection arrangement incorporates a sample of natural polyethylene with an included defect, or flaw, a light source containing near infrared wavelengths, and a video camera. Natural polyethylene has relatively high spectral transmissivity for wavelengths in the band of near infrared wavelengths. The video camera collects data from a beam of the near infrared light which either reflects from or is transmitted directly through a portion of the natural polyethylene sample. Data is collected from both defect free portions of the polyethylene sample and portions of polyethylene sample including at least one defect. A visual image of the polyethylene sample and included defect is produced on either a video monitor, a paper print out, or a photograph. The method for inspecting a sample of cable or a continuously moving section of cable also is described.</p> |
申请公布号 |
EP0373796(A2) |
申请公布日期 |
1990.06.20 |
申请号 |
EP19890312503 |
申请日期 |
1989.11.30 |
申请人 |
AMERICAN TELEPHONE AND TELEGRAPH COMPANY |
发明人 |
ORTIZ, MARCOS GERMAN;STIX, MARSHA SPALDING |
分类号 |
G01N21/88;G01N21/89;G01N21/892;G01N21/95;G01N21/952;H01B3/44;H01B9/02;H04N7/18 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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