Instrument for the measurement of x-ray beam characteristics

摘要

An instrument for measuring the characteristics of an x-ray unit includes two pairs of photo detectors to measure the kVp of the x-ray beam, a single photo detector to measure the relative film exposure produced by the beam and another single photo detector used to measure the relative current in milliamps (mA) of the x-ray unit. The instrument multiplexes the signals and converts them to digital form for storage and analysis by a microprocessor. The output is a display the contents of which is user selectable either by a switch panel or through use of a remote control unit.