ELECTRON BEAM TESTER,申请号JP19880312530-传众专利搜索

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发明名称	ELECTRON BEAM TESTER
摘要
申请公布号	JPH02157665(A)	申请公布日期	1990.06.18
申请号	JP19880312530	申请日期	1988.12.09
申请人	FUJITSU LTD	发明人	OKUBO KAZUO;HAMA SOICHI;OZAKI KAZUYUKI;ISHIZUKA TOSHIHIRO;ABE TAKAYUKI
分类号	G01R19/00;G01R31/302	主分类号	G01R19/00
代理机构		代理人
主权项
地址

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