| 摘要 |
PURPOSE:To prevent decision error by providing test enable storage means which are reset with transitions from the action of a test working circuit to the stoppage or from the establishment of the test condition to the unestablished condition. CONSTITUTION:When either one side of switches A, B at least is L-level, an AND gate 31 is being closed thereby the test working circuit 33 is actuated. The CL input of a flip-flop is made H-level at this time. The action of the test working circuit33 is finished or interrupted when the specified action is finished or the test working is requested to stop by some input or other. At this time, the CL input of the flip-flop is made L-level, and since an input signal is fetched by the flip-flop at the fall, a Q output is fetched by a D input and a Q output is made L-level. If once the Q output is made L-level, the gate 31 is never opened, thus, the problem misdeciding the test working or malfunction is eliminated. |
