LIGHT WAVELENGTH ANALYZING/MEASURING APPARATUS,申请号JP19880311167-传众专利搜索

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发明名称	LIGHT WAVELENGTH ANALYZING/MEASURING APPARATUS
摘要
申请公布号	JPH02156124(A)	申请公布日期	1990.06.15
申请号	JP19880311167	申请日期	1988.12.08
申请人	NEC CORP	发明人	HENMI NAOYA
分类号	G01J3/18;G01J3/443	主分类号	G01J3/18
代理机构		代理人
主权项
地址

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