| 摘要 |
<p>In order to eliminate the bulk of wire connections in test fixtures, there is provided a wireless test fixture (10) for interfacing a unit under test (UUT) (12) to a distributed receiver (38) of automatic test equipment which includes an interface PCB (28) and an array of floating probes (18) mounted in a specially constructed probe plate (16). The interface PCB (28) has a first set of electrically conductive pads (50) on its upper surface (52) arranged in a custom layout which exactly matches the pattern of test sites on the underside of the UUT (12). A second set of electrically conductive pads (54) is provided on the lower surface (56) of the interface PCB (28) in a pattern which exactly matches the field of probes (42) of a distributed receiver (38). Individual pads of the two sets are selectively connected by interconnection paths of reduced, controlled length which also allow for subsequent modification of the interconnections.</p> |
