| 摘要 |
A semiconductor device comprising an array of analogue circuits and components configured on individual tiles (17) arranged in rows and columns includes strips (18, 20) of conductive material extending between the circuits and components, with analogue switches (22) enabling individual analogue circuits and components to be connected in turn to associated test equipment (24) to test the integrity of the circuits and components. The strips (18, 20) are preferably of polysilicon or metal. The invention includes a method of testing such devices. |
