发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE:To improve a semiconductor memory device in the degree of integration by a method wherein RAM cells constituting a memory cell array of the semiconductor memory device are surrounded with a field shield isolating structure so as to be insulated and isolated. CONSTITUTION:A RAM 1 is composed of a transfer gate transistor (Tr) 2, a gate oxide film 12, a shield electrode layer 13, and a capacitor 3 formed on a semiconductor substrate 4. The RAM cell 1 is insulated and isolated by an element isolating region 16 of a field shield isolating structure composed of an impurity diffusion layer 5 of the Tr 2 and others which keeps the Tr 2 in an OFF-state always. The layer 5 is formed as being self-aligned to the region 16, a capacitor is extended to a position above a layer 13, whereby the RAM cell 1 is not required to be insulated and isolated using a thick oxide film, so that obstacles to high integration caused by a redundant region such as a bird's beak or the like can be completely eliminated and the RAM cell 1 can be easily and highly integrated.
申请公布号 JPH02153565(A) 申请公布日期 1990.06.13
申请号 JP19890167578 申请日期 1989.06.29
申请人 MITSUBISHI ELECTRIC CORP 发明人 WAKAMIYA WATARU;SATO SHINICHI;OZAKI KOJI;EMORI TAKAHISA;TANAKA YOSHINORI
分类号 H01L21/76;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108 主分类号 H01L21/76
代理机构 代理人
主权项
地址