首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
METHOD AND APPARATUS FOR MULTIWAVELENGTH EMISSION ANALYSIS
摘要
申请公布号
JPH02147841(A)
申请公布日期
1990.06.06
申请号
JP19880303174
申请日期
1988.11.29
申请人
RES DEV CORP OF JAPAN;ICHIMURA TSUTOMU;MIYAZAWA HARUO
发明人
ICHIMURA TSUTOMU;MIYAZAWA HARUO;RONARUDO SUKOTSUTO;INABA FUMIO
分类号
G01J3/18;G01J3/443;G01N21/27;G01N21/76
主分类号
G01J3/18
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Optimizing switching sequence in the case of switched antenna arrays
RFID transmitter for remote control
Communication system and sample rate converter thereof
Method and apparatus for providing public transportation service in a communication system
Real time telemetry
Multilayer band pass filter
Variable gain amplifier
Gain calibration of a high speed amplifier
Temperature detecting apparatus, switch capacitor apparatus and voltage integrating circuit thereof
Circuit for controlling variation in frequency of clock signal
Switch controller, switch control method, and power supply device comprising the switch controller
Digital communications test system for multiple input, multiple output (MIMO) systems
Position detecting device
State based full and empty control for rechargeable batteries
Non-contact charging module, electronic apparatus, and non-contact charging apparatus
Integral electric power/compact construction equipment system
Control method of electronic parking brake system
Electronic ballast with dimming circuit
LED driving control circuit and LED driving circuit
Acoustic wave device and multilayered substrate
