发明名称 |
SAMPLE MOVING DEVICE, SAMPLE MOVING SYSTEM AND SEMICONDUCTOR MANUFACTURING DEVICE |
摘要 |
<p>PURPOSE:To improve the positioning accuracy of a sample by equipping a fine moving actuator provided on a base, a fine moving stage driven thereby, a rough movement driving mechanism installed thereon, a rough movement stage driven thereby and a holding means adsorbing a sample base. CONSTITUTION:A rough movement stage 2 driven by an actuator 223 for driving the rough movement stage and a fine movement stage 3 driven by the actuator 319 for driving the fine movement stage are mounted on a base 1 together drivably independently respectively. The position of a movable carrier 4 adsorbed with a wafer 5 is directly measured by a measuring machine 8. In case of largely moving the movable carriage 4 suction and release are alternately repeated between the stage 2 and 3. At the step moving time it is moved by being sucked to the stage 2 and at the fine movement time for positioning moved by being sucked to the stage 2. Consequently the movement of the stages 2 and 3 can independently be performed without any mutual interference and the positioning error of the wafer 5 is only by the effect of the control error of the stage 3.</p> |
申请公布号 |
JPH02139150(A) |
申请公布日期 |
1990.05.29 |
申请号 |
JP19880287683 |
申请日期 |
1988.11.16 |
申请人 |
HITACHI LTD |
发明人 |
KOBAYASHI ISAO;HAMADA YOSUKE;MORI KENJI;HIRAI HIROTAKE |
分类号 |
B23Q1/00;B23Q1/34;B23Q1/44;B23Q1/48;B23Q1/56;B23Q5/22;B23Q5/28;B23Q5/34;B23Q5/36;G01Q10/02;G01Q10/04;G01Q80/00;G03F7/20;G05D3/00;H01L21/027;H01L21/30;H01L21/68 |
主分类号 |
B23Q1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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