发明名称 MOS transistor construction with self aligned silicided contacts to gate, source, and drain regions
摘要 An improved integrated circuit structure is disclosed comprising MOS devices formed with at least raised polysilicon gate contact portions. Metal silicide is formed over at least a portion of the source and drain regions to provide conductive paths to the source and drain contacts. In a preferred embodiment, the source and drain contacts also comprise raised contacts which are also formed from the same polysilicon layer to permit formation of a highly planarized structure with self-aligned contacts formed by planarizing an insulating layer formed over the structure sufficiently to expose the upper surface of all of the contacts.
申请公布号 US4929992(A) 申请公布日期 1990.05.29
申请号 US19860869759 申请日期 1986.06.02
申请人 ADVANCED MICRO DEVICES, INC. 发明人 THOMAS, MAMMEN;WEINBERG, MATTHEW
分类号 H01L21/768;H01L21/8249;H01L27/06 主分类号 H01L21/768
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