发明名称 CHARGED PARTICLE DENSITY DISTRIBUTION MEASUREMENT DEVICE
摘要 PURPOSE:To make charged particle density distribution of arbitrary resolution capable visual confirmation by scanning ion beams in the X and Y direction and selecting analysis 6-area properly to substantially divide into small. CONSTITUTION:When an ion beam 11 is irradiated on an analysis plate 4, with the use of a personal computer 8 X-scan drive, X-position sensor 5, Y-scan drive and Y-position sensor 6 is driven to scan the ion beam 11 in the X and Y direction and respective X-Y information of the ion beam 11 is transmitted to the personal computer 8. The information processed in the personal computer 8 is sent in a storage scope 9 and the charged particle density distribution of the ion beam 11 is displayed to confirm visually.
申请公布号 JPH02138894(A) 申请公布日期 1990.05.28
申请号 JP19880153081 申请日期 1988.06.20
申请人 MITSUBISHI ELECTRIC CORP 发明人 YASUDO TAMAKI
分类号 G01T1/29;H01J37/04;H01J37/244 主分类号 G01T1/29
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