发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE:To prevent the decrease of threshold voltage caused by electric field concentration, restrain the inverse narrow channel effect, and microminiaturize a memory cell by installing a diffusion region of the sme conductivity type as a channel region on both ends in the width direction of the channel region of an island type epitaxial semiconductor layer. CONSTITUTION:The concentration of a semiconductor substrate 21a is made high, and that of an epitaxial semiconductor layer 21b is made comparatively low; an island type epitaxial semiconductor 21b is formed by isolating a part between grooves 23 with an insulator layer 22. On the peripheral part of the island type epitaxial semiconductor layer 21b, a P<+> type diffusion region 35 is formed, and arranged on the peripheral part where the gate electrode 30 of an MOS transistor functioning as a word line and the island type epitaxial semiconductor layer 21b intersect each other. The P<+> type diffusion region 35 is arranged on the peripheral end of an insulator layer 22 in the width direction of a channel region 28 of the MOS transistor, thereby preventing the decrease of the threshold voltage of a gate oxide film 29 caused by the electric field concentration at the peripheral end. As a result, the increase of current at the peripheral end in the width direction of the channel region 28 caused by electric field concentration can be prevented.
申请公布号 JPH02137263(A) 申请公布日期 1990.05.25
申请号 JP19880291458 申请日期 1988.11.17
申请人 SANYO ELECTRIC CO LTD 发明人 AZUMA KOJI;MATSUDA JUNICHI
分类号 H01L27/10;H01L21/8242;H01L27/108 主分类号 H01L27/10
代理机构 代理人
主权项
地址