发明名称 INSPECTION DEVICE FOR SEMICONDUCTOR ELEMENT
摘要 PURPOSE:To improve operation efficiency by adding a device for automatically contacting the position of a probe by means of a manipulator onto the electrode section of the semiconductor element or wiring with high accuracy. CONSTITUTION:The positioning mechanisms of each of a horizontal surface and a vertical surface are mounted to the porbe 2. The positioning mechanism in the horizontal surface consists of a rotary mechanism and a fore-and-aft driving mechanism. The rotary mechanism is composed of a gear 5 rotating around a shaft 7, a screwing screw 4 turning the gear 5 and a motor 3 driving the screwing screw 4, and a probe supporter 1 is rotated through the revolution of the gear 5. The fore-and-aft driving mechanism is made up of a screwing screw 9 connected to the probe supporter 1 and a motor 3' giving the screw 9 revolution, the screwing screw 9 is turned by means of the motor 3', the probe supporter 1 slides on a guide 10 and is moved fore and aft, and the probe 2 is positioned in the horizontal surface by means of the two mechanisms. The probe is positioned in the vertical surface in such a manner that a screwing screw 8 is rotated by means of a motor 3'' and the inclined plane of the pushing hardware 9 slides on the bottom surface of the probe supporter 1 and moves the bottom surface vertically. A position controller 30 previously memorizes the coordinate value of the position of the probe 2, and controls the drive of the motors 3, 3'.
申请公布号 JPS5867036(A) 申请公布日期 1983.04.21
申请号 JP19810165326 申请日期 1981.10.16
申请人 NIPPON DENKI KK 发明人 MATAI SADAO
分类号 H01L21/66;(IPC1-7):01L21/66 主分类号 H01L21/66
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