发明名称 |
Method and apparatus for monitoring the thickness profile of a strip |
摘要 |
A method of monitoring the thickness of a longitudinally moving strip to permit quick detection of continuous defects includes the steps of scanning the strip a predetermined number of times measuring the thickness at a plurality of sites across the strip width for thereby generating a plurality of data sets, or scans, with each data set indicative of the thickness profile of the strip. The scans are smoothed by combining the data sets and thereby generating a single representative profile. Additional profiles are generated and displayed in three dimensional format so that a plurality of profiles in sequential relation are continuously displayed to permit a continuous defect, when occurring, to be detected and displayed from at least one profile to an immediately subsequent profile.
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申请公布号 |
US4928257(A) |
申请公布日期 |
1990.05.22 |
申请号 |
US19880147895 |
申请日期 |
1988.01.25 |
申请人 |
BETHLEHEM STEEL CORPORATION |
发明人 |
YERKES, JAMES E.;LETHEN, THEODORE H. |
分类号 |
G01B15/02 |
主分类号 |
G01B15/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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