发明名称 Method and apparatus for monitoring the thickness profile of a strip
摘要 A method of monitoring the thickness of a longitudinally moving strip to permit quick detection of continuous defects includes the steps of scanning the strip a predetermined number of times measuring the thickness at a plurality of sites across the strip width for thereby generating a plurality of data sets, or scans, with each data set indicative of the thickness profile of the strip. The scans are smoothed by combining the data sets and thereby generating a single representative profile. Additional profiles are generated and displayed in three dimensional format so that a plurality of profiles in sequential relation are continuously displayed to permit a continuous defect, when occurring, to be detected and displayed from at least one profile to an immediately subsequent profile.
申请公布号 US4928257(A) 申请公布日期 1990.05.22
申请号 US19880147895 申请日期 1988.01.25
申请人 BETHLEHEM STEEL CORPORATION 发明人 YERKES, JAMES E.;LETHEN, THEODORE H.
分类号 G01B15/02 主分类号 G01B15/02
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