Method and apparatus for line-modified asymmetric crystal topography

摘要

An improved asymmetric crystal topography x-ray imaging system employing a fine focus horizontal line source of x-rays and a crystal monochromator used in a compression mode. Relatively large horizontal and vertical dimensions of the monochromating crystal allow imaging of larger areas of imperfect crystals than previously possible, without adversely affecting image resolution. The high resolution two-dimensional images are a direct consequence of our method of controlling the probe beam divergences. An appreciably enhanced and useful intensity of monochromatic x-rays is obtained over that available with prior asymmetric crystal topography systems.